Grain Yield, Quality and Deoxynivalenol (DON) Contamination of Durum Wheat (Triticum Durum Desf.): Results of National Networks in Organic and Conventional Cropping Systems
Submitted: 27 December 2010
Accepted: 27 December 2010
Published: 19 October 2010
Accepted: 27 December 2010
Abstract Views: 1745
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All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.
How to Cite
Quaranta, F., Amoriello, T., Aureli, G., Belocchi, A., D’Egidio, M. G., Fornara, M., Melloni, S., & Desiderio, E. (2010). Grain Yield, Quality and Deoxynivalenol (DON) Contamination of Durum Wheat (Triticum Durum Desf.): Results of National Networks in Organic and Conventional Cropping Systems. Italian Journal of Agronomy, 5(4), 353–366. https://doi.org/10.4081/ija.2010.353
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